Your Pathway to Quantitative Answers

Visual SI Advanced from Object Research Systems (ORS) is an advanced analysis software solution for 3D data acquired by a variety of technologies including X-ray microscopy and FIB-SEM. Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high-definition exploration into the details and properties of 3D datasets. It offers 2D and 3D image filtering modules and thresholding. Segmentation can be performed automatically or with user assistance generating 3D surface reconstruction to visualize and measure properties, including areas, volumes, counts, distributions, and orientations.

Visual SI Advanced delivers cutting-edge 3D imaging and analysis techniques with high display speeds and the ability to handle large datasets.

Configurable

Visual SI Advanced is a configurable solution that allows you to tailor the tools that are optimal for your workflow. Choose from plug-ins that allow you to control the appearance of a volume, and to register and map differences.

Flexible

Visual SI Advanced also supports regular and unstructured surface meshes with a number of mesh plug-ins and advanced editing tools to create a region of interest from a mesh and vice-versa. With the Plug-In Development Kit (PDK), you can easily leverage the Visual SI Advanced core technology and quickly build specialized workflows.



Voids in sintered glass imaged by Versa XRM.
Courtesy Schott A.G.

Shale Imaged by Crossbeam.
Courtesy University of Warsaw



High-impact visualization

• Render volumes in high definition
• Flexibly inspect multi-planar slices
• Achieve high quality surface rendering

Image processing and segmentation

• Remove noise with state-of-the art algorithms
• Employ mathematical morphology routines
   - Dilation
   - Erosion
   - Opening
   - Closing
   - Distance transform
   - Watershed transform
• Set thresholds based on intensity
• Apply intuitive masking operations
• Expand point segmentation with smart region-growing tools
• Use interactive labeling tools

User-interactive inspection

• Measure distances, angles, and paths
• Annotate features to highlight important findings
• Investigate intensity with spot-probes and line profiles
• Use histogram tools for statistical analysis
• Select magnifying glass for fast multi scale visualization and inspection

System requirements

• 8 GB RAM (32 GB recommended)
• Workstation-class 3D graphics card (Nvidia Quadro or ATI FireGL)
• Windows Vista, 7, 8 (64-bit versions)

Customize and extend

• Connect to MATLAB and IDL to harness established libraries of image processing algorithms
• Develop tightly integrated plug-ins with the full featured Plug-In Development Kit (PDK)
        - Versatile language support (C/C++, .NET, Java, FORTRAN, VB and others)
        - Standard image processing and visualization libraries (ITK and VTK)
        - Leverage ORS routines for data import, data structures, and event-handling

Analyze

• Study volume metrics including porosity, particle/void analysis
• Measure surface areas
• Measure min, max, and mean intensity values and standard deviation
• Profile intensity distribution within selected areas

Showcase your results

• Reveal key insights with high-resolution screenshots
• Tell dynamic stories with easy-to-produce animations and fly-through/zoom movies
       - On-screen playback directly within
        Visual SI Advanced
       - Captured in a stack of image files
        (JPG, BMP, TIFF, PNG)
       - Produced directly to an AVI file

Import data

• Image formats: ZEISS TXM, TIFF, BMP, DICOM, RAW
• Mesh formats: 3D studio Max, ASCII, BREP, CS FDB, DirectX, IGES, OBJ, PLY, STEP, STL, VRML, VTK polydata (VTK), VTK polydata XML (VTP), VTK unstructured grid (VTK), Mesh, ORS XML

Export data

• Image formats: BMP, JPG, PNG, DDS, DIB, HDR, PFM
• Mesh formats: Direct X, OpenInventor 2.0, STL, VRML, WaveFront, VTK, MESH, ORS XML, PLY
• Save session: XML, DICOM
• Save high DPI poster-size images in a variety of formats
• Publish reports directly to PDF



Advanced Segmentation Toolkit Render Options Interactive Color Map Extensible Plugin Support Display Advanced Features 2D Viewport 3D Viewport Thumbnail File Display Brightness and Contrast Filtering, Segmentation, and Analysis Export Options Measurement and Annotation Affine Transforms for Image Processing Selectable Layouts and Viewports


1. Advanced Segmentation Toolkit
2. Measurement and Annotation
3. Affine Transforms for Image Processing
4. Export Options
5. Selectable Layouts and Viewports
6. Filtering, Segmentation, and Analysis
7. Brightness and Contrast
8. Thumbnail File Display
9. 3D Viewport
10. 2D Viewports
12. Render Options
12. Interactive Color Map
13. Display Advanced Features


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The best way to understand Visual SI Advanced is to start using it.

Using advanced visualization techniques and state-of-the-art volume rendering Visual SI Advanced enables high-quality insight into the details and properties of 3D datasets.

It offers 2D and 3D image filtering modules, thresholding, and automated or assisted segmentation with 3D surface reconstruction to visualize and measure properties including areas, volumes, counts, distributions, and orientations.


System requirements

• 8 GB RAM (32 GB recommended)
• Workstation-class 3D graphics card (Nvidia Quadro or ATI FireGL)
• Windows Vista, 7, 8 (64-bit versions)


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Visual SI Advanced

Imaging and Analysis Software


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Visual SI Advanced

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